Cell front side inspection system
FS color and SiNx coating thickness:
The ATM FS- color and SiNx coating inspection system is a fast, non-contact technology and very small and easy to use system to detect defects in cells for solar production application.
Types of defects:
- Cell size
- Cell orthogonality
- Print position
- Print rotation
- Print size
- SiN coating thickness (avg)
- SiN coating color (avg)
- SiN coating
- Color inhomogeneity (avg)
- Delta towards reference value deltaE
- Color stains
- Lightness (L value of LAB color space)
- Light class for middle or dark
Features: