Wafer micro cracks inspection system:

The ATM micro cracks inspection system is a fast, non-contact technology and very small and easy to use system to detect defects in wafers for solar production application.

Types of defects:

- Micro cracks
- Cracks
- Holes
- Inclusion

Features:

• 3600 wafers/h
• Non contact
• Very small and easy to use
• Halogen light within fiber glass
• SHR- camera
• Ethernet tools
• Remote control
• Intelligent software
• Connection to the master PC
• And more