Product data sheet

Cell EL- µ Cracks and Hot Spot

Article number: 03-0001-09-00

Cell front side inspection system
EL- inspection technology:

The ATM EL inspection system is a fast, EL contact technology and very small and easy to use system to detect defects in cells for solar production application.

Types of defects:

- Micro cracks
- Cracks
- Hot spot


  • Up to 2200 cells/h
  • Contact based inspection
  • Very small and easy to use
  • SHR- camera
  • Ethernet tools
  • Remote control
  • Intelligent software
  • Connection to the master PC
  • And more

Product images