Cell front side inspection system
EL- inspection technology:

The ATM EL inspection system is a fast, EL contact technology and very small and easy to use system to detect defects in cells for solar production application.

Types of defects:

- Micro cracks
- Cracks
- Hot spot

Features:

• Up to 2200 cells/h
• Contact based inspection
• Very small and easy to use
• SHR- camera
• Ethernet tools
• Remote control
• Intelligent software
• Connection to the master PC
• And more