Wafer- MDP life time- on the fly:
We deliver complete Wafer MDP life time measurement systems tested and calibrated within 1 or 3 traces including:
Industrial PC, complete software, cable, communication tools soft- and hardware
for Ethernet, MDP measurement software with statistic, zooming, reporting, electric and electronic, cover and all the mechanical tools, assembled and tested.
Scope: 0,1 micro s - 100 ms
Repeatability: +/- 1%
Features:
Option life time 3 traces:
For 3 traces
Article number:
02-0000-07-01